Measurements of contact potential difference (work functions) of metals and semiconductors surface by the static ionized capacitor method

Author： Novikov S.N.   Timoshenkov S.P.  

Publisher： Elsevier

ISSN： 0001-8686

Source： Advances in Colloid and Interface Science, Vol.105, Iss.1, 2003-09, pp. : 329-339

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