Bulk and Young's modulus of doped UO 2 by synchrotron diffraction under high pressure and Knoop indentation

Author: Pujol M.C.   Idiri M.   Havela L.   Heathman S.   Spino J.  

Publisher: Elsevier

ISSN: 0022-3115

Source: Journal of Nuclear Materials, Vol.324, Iss.2, 2004-01, pp. : 189-197

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