Measurement of full-field curvature and geometrical instability of thin film-substrate systems through CGS interferometry

Author： Park T.-S. Suresh S. Rosakis A.J. Ryu J.

Publisher： Elsevier

ISSN： 0022-5096

Source： Journal of the Mechanics and Physics of Solids, Vol.51, Iss.11, 2003-11, pp. : 2191-2211

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