Diagnostics of semiconductor structures by means of an apertureless near-field terahertz microscope

Author: Trukhin V.  

Publisher: Springer Publishing Company

ISSN: 0033-8443

Source: Radiophysics and Quantum Electronics, Vol.54, Iss.8-9, 2012-01, pp. : 577-584

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract