Growth types and surface topography of Co, Cu and Co/Cu multilayers studied by AES and STM/SFM

Author： Marszalek M. Jaworski J. Wider H. Schatz G.

Publisher： Elsevier

ISSN： 0042-207X

Source： Vacuum, Vol.72, Iss.2, 2003-10, pp. : 97-101

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