Reverse recovery characteristics and defect distribution in an electron-irradiated silicon p-n junction diode

Author: Kang S.M.   Eom T.J.   Kim S.J.   Kim H.W.   Cho J.Y.   Lee C.  

Publisher: Elsevier

ISSN: 0254-0584

Source: Materials Chemistry and Physics, Vol.84, Iss.1, 2004-03, pp. : 187-191

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