A study of topographic effects on chemical force microscopy using adhesive force mapping

Author: Sato F.   Okui H.   Akiba U.   Suga K.   Fujihira M.  

Publisher: Elsevier

ISSN: 0304-3991

Source: Ultramicroscopy, Vol.97, Iss.1, 2003-10, pp. : 303-314

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next