In-plane contributions to phase contrast in intermittent contact atomic force microscopy

Author: Marcus M.S.   Eriksson M.A.   Sasaki D.Y.   Carpick R.W.  

Publisher: Elsevier

ISSN: 0304-3991

Source: Ultramicroscopy, Vol.97, Iss.1, 2003-10, pp. : 145-150

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