

Publisher: Elsevier
ISSN: 0308-5961
Source: Telecommunications Policy, Vol.27, Iss.8, 2003-09, pp. : 559-561
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Related content


Mobile Networks and Applications, Vol. 11, Iss. 3, 2006-06 ,pp. :


By Hou Y. Ramanathan Parameswaran
Mobile Networks and Applications, Vol. 11, Iss. 1, 2006-02 ,pp. :


By Agrawal V.D.
Journal of Electronic Testing, Vol. 16, Iss. 4, 2000-08 ,pp. :


By Agrawal V.D.
Journal of Electronic Testing, Vol. 16, Iss. 5, 2000-10 ,pp. :


By Agrawal V.D.
Journal of Electronic Testing, Vol. 12, Iss. 3, 1998-06 ,pp. :