Author: Bodunov D.
Publisher: Springer Publishing Company
ISSN: 0543-1972
Source: Measurement Techniques, Vol.55, Iss.10, 2013-01, pp. : 1137-1140
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
Prospects for development of nanometrology
Measurement Techniques, Vol. 53, Iss. 8, 2010-11 ,pp. :
By Krasheninina M. Medvedevskikh M. Medvedevskikh S. Neudachina L. Sobina E.
Measurement Techniques, Vol. 56, Iss. 9, 2013-12 ,pp. :