Author: Onishi K. Kumakura T. Fujita D.
Publisher: Elsevier
ISSN: 0749-6036
Source: Superlattices and Microstructures, Vol.32, Iss.4, 2002-10, pp. : 249-253
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Related content
HIGH RESOLUTION ELECTRON BEAM INJECTION IN SEMICONDUCTORS USING A SCANNING TUNNELING MICROSCOPE
Le Journal de Physique IV, Vol. 01, Iss. C6, 1991-12 ,pp. :
A SCANNING TUNNELING MICROSCOPE FOR SURFACE MODIFICATION
Le Journal de Physique Colloques, Vol. 47, Iss. C2, 1986-03 ,pp. :