A New Method to Measure Small Amounts of Solute Atoms on Planar Defects and Application to Inversion Domain Boundaries in Doped Zinc Oxide

Author： Walther T.  

Publisher： Springer Publishing Company

ISSN： 0927-7056

Source： Interface Science, Vol.12, Iss.2-3, 2004-04, pp. : 267-275

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