Characterization of the reliability and uniformity of an anodization-free fabrication process for high-quality Nb/Al-AlO x /Nb Josephson junctions

Author: Kempf S.   Ferring A.   Fleischmann A.   Gastaldo L.   Enss C.  

Publisher: IOP Publishing

ISSN: 0953-2048

Source: Superconductor Science and Technology, Vol.26, Iss.6, 2013-06, pp. : 65012-65020

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Abstract