Microscopic analysis of the chemical reaction between Fe(Te, Se) thin films and underlying CaF 2

Author: Ichinose A.   Nabeshima F.   Tsukada I.   Hanawa M.   Komiya Seiki   Akiike T.   Imai Y.   Maeda A.  

Publisher: IOP Publishing

ISSN: 0953-2048

Source: Superconductor Science and Technology, Vol.26, Iss.7, 2013-07, pp. : 75002-75011

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