Author: Ceccherini S.
Publisher: IOP Publishing
ISSN: 0963-9659
Source: Pure and Applied Optics: Journal of the European Optical Society Part A, Vol.7, Iss.6, 1998-01, pp. : 1289-1300
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Abstract
The distinction between the coherent and the incoherent component of the radiation emitted from resonantly excited material systems is difficult experimentally, particularly when ultra-short optical pulses are used for excitation. We propose an experimental procedure allowing an easy measurement of the two components. The method is completely general and applicable to any kind of physical system; its feasibility is demonstrated on the resonant emission from excitons in a semiconductor quantum well.