Electromigration study of SNS ramp edge Josephson junctions

Author： Sydow J.P.   Chamberlain D.   Buhrman R.A.   Char K.   Moeckly B.H.  

Publisher： Elsevier

ISSN： 0964-1807

Source： Applied Superconductivity, Vol.6, Iss.10, 1999-10, pp. : 511-517

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