Author: Tsang S.C. Burch R. Nishiyama S. Gleeson D. Cruise N.A. Glidle A. Caps V.
Publisher: Elsevier
ISSN: 0965-9773
Source: Nanostructured Materials, Vol.12, Iss.5, 1999-01, pp. : 999-1002
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Related content
Characterization of rf-sputtered indium tin oxide thin films
By Bhatti M.T. Rana A.M. Khan A.F.
Materials Chemistry and Physics, Vol. 84, Iss. 1, 2004-03 ,pp. :