Resolution enhancement by subtraction of confocal signals taken at different pinhole sizes

Author： Heintzmann R.   Sarafis V.   Munroe P.   Nailon J.   Hanley Q.S.   Jovin T.M.  

Publisher： Elsevier

ISSN： 0968-4328

Source： Micron, Vol.34, Iss.6, 2003-10, pp. : 293-300

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