Quantitative estimation of efficiency of wavelet-processing images for single crystal structure defects

Author: Tkal V.   Petrov M.  

Publisher: MAIK Nauka/Interperiodica

ISSN: 1027-4510

Source: Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques, Vol.5, Iss.3, 2011-06, pp. : 419-425

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Abstract