Non-destructive measurement of active-layer thickness of LR 115 SSNTD

Author： Ng F.M.F.   Yip C.W.Y.   Ho J.P.Y.   Nikezic D.   Yu K.N.  

Publisher： Elsevier

ISSN： 1350-4487

Source： Radiation Measurements, Vol.38, Iss.1, 2004-02, pp. : 1-3

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