Surface potential imaging with atomic resolution by frequency-modulation Kelvin probe force microscopy without bias voltage feedback

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Nanotechnology, Vol. 26, Iss. 19, 2015-05 ,pp. : 195701-195707

IOP Publishing

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Local nanotip arrays sculptured by atomic force microscopy to enhance the light-output efficiency of GaN-based light-emitting diode structures

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A Novel Al-Y Codoped ZnO Thin Film as Anode for Organic Light Emitting Diode

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Integrated Ferroelectrics, Vol. 143, Iss. 1, 2013-01 ,pp. : 17-23

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A highly sensitive, direct and label-free technique for Hg²⁺ detection using Kelvin probe force microscopy

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Study of charge separation and interface formation in a single nanorod CdS-Cu x S heterojunction solar cell using Kelvin probe force microscopy

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