An Efficient Heuristic for Peak Capture Power Minimization During Scan-Based Test

Author: Trinadh A. Satya   Potluri Seetal   Babu Ch. Sobhan   Kamakoti V.  

Publisher: American Scientific Publishers

ISSN: 1546-1998

Source: Journal of Low Power Electronics, Vol.9, Iss.2, 2013-08, pp. : 264-274

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract