Chandra Shekhar Vikram: An Appreciation

By Singh Tushar   Lakhtakia Akhlesh  

Journal of Holography and Speckle, Vol. 5, Iss. 2, 2009-08 ,pp. : 105-106

American Scientific Publishers

Access to resources Recommend Favorite

A Special Issue on Holography and Interferometry for Sensing, Recording, Visualizing and Manipulating Data: Current Research Topics Reflecting the Contribution of Professor Chandra S. Vikram

By Caulfield John H.   Osten Wolfgang   Yaroslavsky Leonid P.   Zalevsky Zeev  

Journal of Holography and Speckle, Vol. 5, Iss. 2, 2009-08 ,pp. : 103-104

American Scientific Publishers

Access to resources Recommend Favorite

New approach to metrology in nanotechnology

By Maksimov S.   Maksimov K.  

Technical Physics Letters, Vol. 36, Iss. 10, 2010-10 ,pp. : 938-941

MAIK Nauka/Interperiodica

Access to resources Recommend Favorite

Morphological method for surface metrology and dimensional metrology based on the alpha shape

By Jiang Xiangqian   Lou Shan   Scott Paul J  

Measurement Science and Technology, Vol. 23, Iss. 1, 2012-01 ,pp. : 15003-15011

IOP Publishing

Access to resources Recommend Favorite

Frequency metrology in the near-infrared spectrum of H217O and H218O molecules: testing a new inversion method for retrieval of energy levels

By  

New Journal of Physics, Vol. 12, Iss. 10, 2010-10 ,pp. : 99-108

IOP Publishing

Access to resources Recommend Favorite