Author: Kane William
Publisher: Springer Publishing Company
ISSN: 1547-7029
Source: Journal of Failure Analysis & Prevention, Vol.13, Iss.3, 2013-06, pp. : 377-380
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
By Na Young-Sang Yeom Jong-Taek Park Nho-Kwang Lee Jai-Young
Metallurgical and Materials Transactions A, Vol. 37, Iss. 1, 2006-01 ,pp. :
Advanced Electron Backscatter Diffraction Applications and Techniques
JOM, Vol. 65, Iss. 9, 2013-09 ,pp. :