Topography-Induced Forces in Amplitude Modulated Dynamic Atomic-Force Microscopy
Author： Stark Robert W.
Publisher： American Scientific Publishers
ISSN： 1557-7937
Source： Journal of Scanning Probe Microscopy, Vol.4, Iss.1, 2009-06, pp. : 1-6
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
Access to resources
Recommend
