Author： Nitschke Jonathan R. Quattropani Anna Corminboeuf Clémence Velonia Kelly Wilkinsoe Kevin J. Kubel Frank
Publisher： Swiss Chemical Society
ISSN： 0009-4293
Source： CHIMIA International Journal for Chemistry, Vol.63, Iss.12, 2009-12, pp. : 874-880
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
Access to resources
Recommend
Calculation of STM profiles for nanometrology
By Sbosny H. Hietschold M. Koenders L.
Thin Solid Films, Vol. 264, Iss. 2, 1995-08 ,pp. :
The College Mathematics Journal, Vol. 41, Iss. 3, 2010-05 ,pp. :
STUDIES IN APPLIED MATHEMATICS, Vol. 97-1421, Iss. 1, 1941-04 ,pp. :
STUDIES IN APPLIED MATHEMATICS, Vol. 20, Iss. 1, 1941-04 ,pp. :