Author: Chong Lee
Publisher: Taylor & Francis Ltd
ISSN: 0740-817X
Source: IIE Transactions, Vol.36, Iss.12, 2004-12, pp. : 1193-1199
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
Stochastic models for degradation-based reliability 1
By KHAROUFEH JEFFREY COX STEVEN
IIE Transactions, Vol. 37, Iss. 6, 2005-06 ,pp. :