Author: Zhang Hang
Publisher: Taylor & Francis Ltd
ISSN: 0740-817X
Source: IIE Transactions, Vol.41, Iss.4, 2009-04, pp. : 335-345
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
Techniques to interpret T 2 control chart signals
IIE Transactions, Vol. 38, Iss. 8, 2006-08 ,pp. :
By Wu Zhang Xie Ming Liu Qingchuan Zhang Yu
The International Journal of Advanced Manufacturing Technology, Vol. 30, Iss. 5-6, 2006-09 ,pp. :
By Bulychev O. Shleenkov S. Lisienko V. Shleenkov A.
Russian Journal of Nondestructive Testing, Vol. 46, Iss. 4, 2010-04 ,pp. :