

Author: del Castillo Enrique Santiago Eduardo
Publisher: Taylor & Francis Ltd
ISSN: 0740-817X
Source: IIE Transactions, Vol.43, Iss.1, 2011-01, pp. : 54-68
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content


A Review of: “Experiments: Planning, Analysis, and Parameter Design Optimization”
By Jeff Wu C.
IIE Transactions, Vol. 38, Iss. 6, 2006-06 ,pp. :








By Elangovan Sooriyamoorthy Prakasan K. Jaiganesh V.
The International Journal of Advanced Manufacturing Technology, Vol. 51, Iss. 1-4, 2010-11 ,pp. :