Author: Tu X. M. Kowalski J. Begley A. Houck P. Mazumdar S. Miewald J. Buysse D. J. Kupfer D. J.
Publisher: Taylor & Francis Ltd
ISSN: 1360-0532
Source: Journal of Applied Statistics, Vol.28, Iss.8, 2001-11, pp. : 1029-1049
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Abstract