Development of an optimal measuring device selection system using neural networks

Author: S. Son   H. Park   K. H. Lee  

Publisher: Taylor & Francis Ltd

ISSN: 0020-7543

Source: International Journal of Production Research, Vol.41, Iss.17, 2003-11, pp. : 4133-4151

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

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Abstract