Employing dependent virtual samples to obtain more manufacturing information in pilot runs

Author： Li Der-Chiang   Chen Chien-Chih   Chen Wen-Chih   Chang Che-Jung  

Publisher： Taylor & Francis Ltd

ISSN： 0020-7543

Source： International Journal of Production Research, Vol.50, Iss.23, 2012-12, pp. : 6886-6903

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