Assessment of convergence effects in weak-beam transmission electron microscopy in partial spacing measurements in Ni3Al

Author: Meng X.   Schaublin R. E.   Stobbs W. M.  

Publisher: Taylor & Francis Ltd

ISSN: 1362-3036

Source: Philosophical Magazine Letters, Vol.75, Iss.4, 1997-04, pp. : 179-186

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