Transmission electron microscopy study of stacking-fault trapezoids and stacking-fault tubes in ZnSe/GaAs(001) pseudomorphic epitaxial layers

Author： N.Wang Sou I. K. Fung K. K.

Publisher： Taylor & Francis Ltd

ISSN： 1362-3036

Source： Philosophical Magazine Letters, Vol.76, Iss.3, 1997-09, pp. : 153-158

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