Atomic force microscopy of in situ deformed nickel thin films

By Coupeau C.   Naud J.F.   Cleymand F.   Goudeau P.   Grilhe J.  

Thin Solid Films, Vol. 353, Iss. 1, 1999-09 ,pp. : 194-200

Elsevier

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Atomic force microscopy observations of successive damaging mechanisms of thin films on substrates under tensile stress

By George M.   Coupeau C.   Colin J.   Grilhe J.  

Thin Solid Films, Vol. 429, Iss. 1, 2003-04 ,pp. : 267-272

Elsevier

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Damage mode tensile testing of thin gold films on polyimide substrates by X-ray diffraction and atomic force microscopy

By Renault P.O.   Villain P.   Coupeau C.   Goudeau P.   Badawi K.F.  

Thin Solid Films, Vol. 424, Iss. 2, 2003-01 ,pp. : 267-273

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Atomic force microscopy study of the morphological shape of thin film buckling

By Coupeau C.  

Thin Solid Films, Vol. 406, Iss. 1, 2002-03 ,pp. : 190-194

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Worm-like delamination patterns of thin stainless steel films on polycarbonate substrates

By Colin J.   Cleymand F.   Coupeau C.   Grilhe J.  

Philosophical Magazine. A. Physics of Condensed Matter. Defects and Mechanical Properties, Vol. 80, Iss. 11, 2000-11 ,pp. : 2559-2565

Taylor & Francis Ltd

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