Open-ended stacking-fault tetrahedra in X-ray topographs of cubic silicon carbide

Author: Vetter W. M.   Dudley M.  

Publisher: Taylor & Francis Ltd

ISSN: 1362-3036

Source: Philosophical Magazine Letters, Vol.83, Iss.8, 2003-08, pp. : 473-476

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract

Related content