A novel method for measurement of electronic work function of micro/nanostructure materials using a Kelvin probe system

Author： Li W.   Wu C. W.   Ke L. M.   Yang C. G.   Wei P.   Zhu S. F.  

Publisher： Taylor & Francis Ltd

ISSN： 1362-3036

Source： Philosophical Magazine Letters, Vol.89, Iss.9, 2009-09, pp. : 557-564

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