High-resolution transmission electron microscopy and computational analyses of atomic structures of [0001] symmetric tilt grain boundaries of Al 2 O 3 with equivalent grain-boundary planes

Author: Matsunaga K.  

Publisher: Taylor & Francis Ltd

ISSN: 1478-6443

Source: Philosophical Magazine, Vol.83, Iss.36, 2003-12, pp. : 4071-4082

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