Author: Volkert C. A. Lilleodden E. T.
Publisher: Taylor & Francis Ltd
ISSN: 1478-6443
Source: Philosophical Magazine, Vol.86, Iss.33-35, 2006-01, pp. : 5567-5579
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
A review of analysis methods for sub-micron indentation testing
Vacuum, Vol. 58, Iss. 4, 2000-09 ,pp. :
Creep of micron-sized aluminium columns
Philosophical Magazine Letters, Vol. 87, Iss. 12, 2007-12 ,pp. :
Sub-micron patterning of solid materials with ultraviolet femtosecond pulses
Applied Physics A, Vol. 79, Iss. 4-6, 2004-09 ,pp. :