Shape memory behaviour of annealed Ti48.5Ni(51.5-x)Cux (x = 6.2-33.5) thin films

Author: Ishida A.   Sato M.  

Publisher: Taylor & Francis Ltd

ISSN: 1478-6443

Source: Philosophical Magazine, Vol.88, Iss.16, 2008-06, pp. : 2439-2448

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Abstract