Combined effects of crystallographic orientation, stacking fault energy and grain size on deformation twinning in fcc crystals

Author: Han W. Z.   Zhang Z. F.   Wu S. D.   Li S. X.  

Publisher: Taylor & Francis Ltd

ISSN: 1478-6443

Source: Philosophical Magazine, Vol.88, Iss.24, 2008-08, pp. : 3011-3029

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Abstract