![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
Author: Bauza M.
Publisher: Taylor & Francis Ltd
ISSN: 1478-6443
Source: Philosophical Magazine, Vol.89, Iss.28-30, 2009-10, pp. : 2531-2539
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
UV light induced defects in amorphous silicon thin films
By Pivac B. Pavlovic M. Kovacevic I. Etlinger B. Zulim I.
Vacuum, Vol. 71, Iss. 1, 2003-05 ,pp. :
![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
Nanocrystalline silicon carbonitride thin films prepared by plasma beam-assisted deposition
By Cao Z.X.
Thin Solid Films, Vol. 401, Iss. 1, 2001-12 ,pp. :
![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
By Voz C. Martin I. Orpella A. Puigdollers J. Vetter M. Alcubilla R. Soler D. Fonrodona M. Bertomeu J. Andreu J.
Thin Solid Films, Vol. 430, Iss. 1, 2003-04 ,pp. :