Electron microscopy and diffraction of defects, nanostructures, interfaces and amorphous materials Conference to mark the retirement of Professor David Cockayne FRS Oxford, 7 September 2009

Author： Hirsch Peter   Kirkland Angus   Nellist Peter  

Publisher： Taylor & Francis Ltd

ISSN： 1478-6443

Source： Philosophical Magazine, Vol.90, Iss.35-36, 2010-12, pp. : 4595-4595

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract

Related content

Professor D.J.H. Cockayne FRS: An appreciation in honour of his retirement in September 2009

By Hirsch P. B.  

Philosophical Magazine, Vol. 90, Iss. 35-36, 2010-12 ,pp. : 4597-4609

Taylor & Francis Ltd

Access to resources Recommend Favorite

David Cockayne

By  

Philosophical Magazine, Vol. 91, Iss. 16, 2011-06 ,pp. : 2077-2077

Taylor & Francis Ltd

Access to resources Recommend Favorite

David Cockayne

By  

Philosophical Magazine Letters, Vol. 91, Iss. 5, 2011-05 ,pp. : 321-321

Taylor & Francis Ltd

Access to resources Recommend Favorite

Professor Sivaramakrishna Chandrasekhar, FRS

By Gray Professor George  

Liquid Crystals, Vol. 31, Iss. 5, 2004-05 ,pp. : 751-752

Taylor & Francis Ltd

Access to resources Recommend Favorite

High-resolution transmission electron microscopy study of defects and interfaces in epitaxial TiO 2 films on sapphire and LaAlO 3

By Y.Huang J.   Park B. H.   Jan David   Pan X. Q.   Zhu Yuntian T.   Jia Q. X.  

Philosophical Magazine. A. Physics of Condensed Matter. Defects and Mechanical Properties, Vol. 82, Iss. 4, 2002-03 ,pp. : 735-749

Taylor & Francis Ltd

Access to resources Recommend Favorite