Topographical observation of silane-treated inorganic surface using atomic force microscopy

Author： Nakamura Yoshinobu   Yokouchi Naoki   Tobita Yoshiyuki   Iida Takeo   Nagata Kazuya  

Publisher： Taylor & Francis Ltd

ISSN： 1568-5543

Source： Composite Interfaces, Vol.12, Iss.7, 2005-09, pp. : 669-681

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract

Related content

Local surface charge dissipation studied using force spectroscopy method of atomic force microscopy

By  

SURFACE AND INTERFACE ANALYSIS, Vol. 47, Iss. 6, 2015-06 ,pp. : 657-662

John Wiley & Sons Inc

Access to resources Recommend Favorite

Atomic force microscopy in the surface characterization of semiconductors and superconductors

By Gonnelli R. S.  

Philosophical Magazine B, Vol. 80, Iss. 4, 2000-04 ,pp. : 599-609

Taylor & Francis Ltd

Access to resources Recommend Favorite

Atomic force microscopy observation of the morphology of tetracyanoquinodimethane (TCNQ) deposited from solution onto the atomically smooth native oxide surface of Al(111) films

By Higo M.   Lu X.   Mazur U.   Hipps K.W.  

Thin Solid Films, Vol. 384, Iss. 1, 2001-03 ,pp. : 90-101

Elsevier

Access to resources Recommend Favorite

Direct observation of the growth of gibbsite crystals by atomic force microscopy

By Freij S.J.   Parkinson G.M.   Reyhani M.M.  

Journal of Crystal Growth, Vol. 260, Iss. 1, 2004-01 ,pp. : 232-242

Elsevier

Access to resources Recommend Favorite

Quantitative wear analysis using atomic force microscopy

By Schofer J.   Santner E.  

Wear, Vol. 222, Iss. 2, 1998-11 ,pp. : 74-83

Elsevier

Access to resources Recommend Favorite