Preparation and characterization of Bi 2 S 3 -PbS thin films by X-ray diffraction, scanning electron microscopy and resistivity studies

Author： Acharya B.S. Nayak B.B. Parhi N.

Publisher： Elsevier

ISSN： 0040-6090

Source： Thin Solid Films, Vol.254, Iss.1, 1995-01, pp. : 47-53

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract

Related content

X-Ray diffraction studies of p-CdS:Cu thin films

By Kashiwaba Y. Komatsu T. Nishikawa M. Ishikawa Y. Segawa K. Hayasi Y.

Thin Solid Films, Vol. 408, Iss. 1, 2002-04 ,pp. : 43-50

Elsevier

Access to resources Recommend Favorite

Electrical and optical properties of thermally evaporated thin films of (As 2 S 3 ) 1-x (PbS) x

By Bhatia K.L. Singh M. Kishore N.

Thin Solid Films, Vol. 293, Iss. 1, 1997-01 ,pp. : 303-309

Elsevier

Access to resources Recommend Favorite

Preparation and Characterization of SnS:Bi Thin Films

By Calderón Triana Clara

Brazilian Journal of Physics, Vol. 41, Iss. 1, 2011-05 ,pp. : 15-20

Springer Publishing Company

Access to resources Recommend Favorite

Preparation and characterization of Bi 2 S 3 thin films spray deposited from non-aqueous media

By Killedar V.V. Lokhande C.D. Bhosale C.H.

Thin Solid Films, Vol. 289, Iss. 1, 1996-11 ,pp. : 14-16

Elsevier

Access to resources Recommend Favorite

Grazing incidence X-ray diffraction and atomic force microscopy analysis of BaBi 2 Ta 2 O 9 thin films

By Mastelaro V.R. Foschini C.R. Varela J.A.

Thin Solid Films, Vol. 415, Iss. 1, 2002-08 ,pp. : 57-63

Elsevier

Access to resources Recommend Favorite