Analysis of the surfaces structure in porous Si

Author： Schoisswohl M.   von Bardeleben H.J.   Morazzani V.   Grosman A.   Ortega C.   Frohnhoff S.   Berger M.G.   Munder H.  

Publisher： Elsevier

ISSN： 0040-6090

Source： Thin Solid Films, Vol.255, Iss.1, 1995-01, pp. : 123-127

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