Acoustic microscopy investigation of porous silicon

Author: Da Fonseca R.J.M.   Saurel J.M.   Foucaran A.   Massone E.   Taliercio T.   Camassel J.  

Publisher: Elsevier

ISSN: 0040-6090

Source: Thin Solid Films, Vol.255, Iss.1, 1995-01, pp. : 155-158

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Abstract