Author: Movtchan I.A. Dreyfus R.W. Marine W. Sentis M. Autric M. Lay G.L. Merk N.
Publisher: Elsevier
ISSN: 0040-6090
Source: Thin Solid Films, Vol.255, Iss.1, 1995-01, pp. : 286-289
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
The effect of ultrasound on the Si‐SiO2 system
PHYSICA STATUS SOLIDI (C) - CURRENT TOPICS IN SOLID STATE PHYSICS, Vol. 9, Iss. 10‐11, 2012-10 ,pp. :
Recombination energy changes due to shell-like defects in Si/SiO 2 quantum dots
By de Sousa J.S. Leburton J.-P. Freire V.N. da Silva E.F.
Physica E, Vol. 17, Iss. unknown, 2003-04 ,pp. :