Application of phase contrast imaging atomic force microscopy to tribofilms on DLC coatings

By Ahn H.-S.   Chizhik S.A.   Dubravin A.M.   Kazachenko V.P.   Popov V.V.  

Wear, Vol. 249, Iss. 7, 2001-07 ,pp. : 617-625

Elsevier

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Application of the needle sensor for microstructure measurements and atomic force microscopy

By Grunewald U.   Bartzke K.   Antrack T.  

Thin Solid Films, Vol. 264, Iss. 2, 1995-08 ,pp. : 169-171

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Design and application of scanning near-field optical/atomic force microscopy

By Ataka T.   Muramatsu H.   Nakajima K.   Chiba N.   Homma K.   Fujihara M.  

Thin Solid Films, Vol. 273, Iss. 1, 1996-02 ,pp. : 154-160

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Damage mode tensile testing of thin gold films on polyimide substrates by X-ray diffraction and atomic force microscopy

By Renault P.O.   Villain P.   Coupeau C.   Goudeau P.   Badawi K.F.  

Thin Solid Films, Vol. 424, Iss. 2, 2003-01 ,pp. : 267-273

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Development and application of a combined atomic force microscopy–nanoindentation system with a silicon tip and a diamond indenter

By Miyahara K.   Nagashima N.   Matsuoka S.  

Philosophical Magazine. A. Physics of Condensed Matter. Defects and Mechanical Properties, Vol. 82, Iss. 10, 2002-07 ,pp. : 2149-2160

Taylor & Francis Ltd

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