Author： Schumacher H.W. Kracke B. Damaschke B.
Publisher： Elsevier
ISSN： 0040-6090
Source： Thin Solid Films, Vol.264, Iss.2, 1995-08, pp. : 268-272
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
Scanning force microscope studies of Langmuir-Blodgett polyaniline thin films
By Porter T.L. Thompson D. Bradley M.
Thin Solid Films, Vol. 288, Iss. 1, 1996-11 ,pp. :
Access to resources
Recommend
Porous thin films for the characterization of atomic force microscope tip morphology
By Vick D. Brett M.J. Westra K.
Thin Solid Films, Vol. 408, Iss. 1, 2002-04 ,pp. :
Scanning force microscopy characterization of thin lipid films on a substrate
By Masai J. Shibata-Seki T. Sasaki K. Murayama H. Sano K.
Thin Solid Films, Vol. 273, Iss. 1, 1996-02 ,pp. :
Manipulation of graphene within a scanning force microscope
PHYSICA STATUS SOLIDI (B) BASIC SOLID STATE PHYSICS, Vol. 246, Iss. 11‐12, 2009-12 ,pp. :